DEPTH SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS BY MEANS OF SCATTERED ELECTRONS

被引：38

作者：

BAVERSTA.U ^{[1
]}

EKDAHL, T ^{[1
]}

BOHM, C ^{[1
]}

RINGSTRO.B ^{[1
]}

STEFANSS.V ^{[1
]}

LILJEQUI.D ^{[1
]}

机构：

[1] UNIV STOCKHOLM,INST PHYS,STOCKHOLM,SWEDEN

来源：

NUCLEAR INSTRUMENTS & METHODS | 1974年 / 115卷 / 02期

关键词：

D O I：

10.1016/0029-554X(74)90235-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：373 / 380

页数：8

共 11 条

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[2]

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[6]

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[7] ANALYSIS OF BACKSCATTER MOSSBAUER-SPECTRA OBTAINED WITH INTERNAL-CONVERSION ELECTRONS [J].

KRAKOWSKI, RA ;

MILLER, RB .

NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (01) :93-+

[8]

Landau L, 1944, J PHYS-USSR, V8, P201

[9]

STARODUBTSEV SV, 1965, PASSAGE CHARGED PART

[10] ANALYSIS OF THIN SURFACE LAYERS BY FE-57 MOSSBAUER BACKSCATTERING SPECTROMETRY [J].

SWANSON, KR ;

SPIJKERMAN, JJ .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (07) :3155-+

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