DETERMINATION OF PLASMA PROPERTIES BY FREE-SPACE MICROWAVE TECHNIQUES

被引：13

作者：

BUSER, R

BUSER, W

机构：

来源：

关键词：

D O I：

10.1063/1.1728944

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2275 / &

共 13 条

[1] MEASUREMENTS OF AMBIPOLAR DIFFUSION IN HELIUM [J].

BIONDI, MA ;

BROWN, SC .

PHYSICAL REVIEW, 1949, 75 (11) :1700-1705

[2] THE FABRY PEROT INTERFEROMETER AT MILLIMETRE WAVELENGTHS [J].

CULSHAW, W .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1953, 66 (403) :597-608

[3]

ENGEL AV, 1944, ELEKTRISCHE GASENTLA, V1

[4]

GARDNER AL, UCRL6232T REP

[5]

GOLANT VE, 1961, SOV PHYS-TECH PHYS, V5, P1197

[6]

GOLANT VE, 1960, J TECH PHYS USSR, V30, P1265

[7]

Oskam HJ., 1958, PHILIPS RES REP, V13, P335

[8]

SHMOYS J, 1960, PIBMRI82860 RES REP

[9] MICROWAVE DETERMINATION OF PLASMA DENSITY PROFILES [J].

WHARTON, CB ;

SLAGER, DM .

[10]

WHARTON CB, 18 RIS REP