ELECTROOPTIC SAMPLING OF SURFACE SPACE-CHARGE FIELDS ON III-V COMPOUNDS

被引：3

作者：

KUTT, W

CHO, GC

STRAHNEN, M

KURZ, H

机构：

[1] Institute of Semiconductor Electronics II, RWTH Aachen, W-5100 Aachen, Sommerfeldstrasse

来源：

APPLIED SURFACE SCIENCE | 1991年 / 50卷 / 1-4期

关键词：

D O I：

10.1016/0169-4332(91)90192-M

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Time-resolved reflective electro-optic sampling (REOS) of ultrafast longitudinal surface fields on III-V compounds is accomplished with 50 fs optical pulses at 2 eV. Ultrafast carrier transport and screening effects of the photoexcited carriers initiate electric field transients short enough to impulsively launch longitudinal-optical phonons, in phase. A high-sensitivity measurement system allows the time-resolved investigation of the coherent phonon modes and carrier transport. In a special example the mapping of process-induced changes in the surface space charge region is demonstrated.

引用

页码：325 / 329

页数：5

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