STRUCTURE STUDIES BY X-RAY AND NEUTRON-DIFFRACTION - HOW ACCURATE ARE THEY

被引：16

作者：

EGAMI, T ^{[1
]}

机构：

[1] UNIV PENN,RES STRUCT MATTER LAB,PHILADELPHIA,PA 19104

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1994年 / 179卷

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0921-5093(94)90156-2

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The atomic structure of amorphous materials is usually studied by X-ray, neutron, or electron diffraction methods, often using the atomic pair density function (PDF) analysis. The accuracy of the PDF method has been greatly improved recently by the advent of synchrotron base facilities, to the extent that the statistical noise has become an important source of error. We show how the statistical error in the PDF can be calculated, and discuss how this would affect the data collection strategy and modeling.

引用

页码：17 / 19

页数：3

共 6 条

[1]

Billinge S. J. L, 1992, THESIS U PENNSYLVANI

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