学术探索
学术期刊
新闻热点
数据分析
智能评审

AN X-RAY METHOD FOR DETERMINATION OF DOMAIN SIZE FROM TAILS OF DIFFRACTION PROFILES

被引：9
作者：
SZANTO, IS
VARGA, L
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1969年 / 2卷
关键词：
D O I：
10.1107/S002188986900656X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Sciences, Budapest
引用
收藏
页码：72 / &
相关论文
共 24 条
[1]   PRACTICAL DETERMINATION OF LATTICE PARAMETERS USING CENTROID METHOD [J].
DELF, BW .
BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (06) :345-&
[2]  
GAAL I, 1965, PRIVATE COMMUNICATIO
[3]   QUANTITATIVE X-RAY DIFFRACTION OBSERVATIONS ON STRAINED METAL AGGREGATES [J].
GREENOUGH, GB .
PROGRESS IN METAL PHYSICS, 1952, 3 :176-219
[4]   THEORY OF MEASUREMENT OF INTEGRATED INTENSITIES OBTAINED WITH SINGLE-CRYSTAL COUNTER DIFFRACTOMETERS [J].
LADELL, J ;
SPIELBERG, N .
ACTA CRYSTALLOGRAPHICA, 1966, 21 :103-+
[5]   VARIANCE AS A MEASURE OF LINE BROADENING - PARTICLE-SIZE DETERMINATION [J].
LANGFORD, JI .
NATURE, 1965, 207 (5000) :966-+
[6]   VARIANCE AND OTHER MEASURES OF LINE BROADENING IN POWDER DIFFRACTOMETRY .I. PRACTICAL CONSIDERATIONS [J].
LANGFORD, JI .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :48-&
[7]  
LANGFORD JI, 1963, CRYSTALLOGRAPHY CRYS, P207
[8]  
MITRA GB, 1964, ACTA CRYSTALLOGR, V17, P785
[9]  
NEUBAUER I, 1969, ACTA TECH HUNG, V64, P287
[10]   COUNTER DIFFRACTOMETER - THE THEORY OF THE USE OF CENTROIDS OF DIFFRACTION PROFILES FOR HIGH ACCURACY IN THE MEASUREMENT OF DIFFRACTION ANGLES [J].
PIKE, ER ;
WILSON, AJC .
BRITISH JOURNAL OF APPLIED PHYSICS, 1959, 10 (02) :57-68
123