OPERATIONAL FEATURES OF A NEW ELECTRON DIFFRACTION UNIT

[1] THE USE OF THE ELECTRON DIFFRACTION CAMERA TO DETECT INSULATING FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1945, 16 (02) : 94 - 96

[2] ON THE IMPROVEMENT OF RESOLUTION IN ELECTRON DIFFRACTION CAMERAS [J]. JOURNAL OF APPLIED PHYSICS, 1946, 17 (01) : 12 - 22

[3] Kikuchi S., 1928, JPN J PHYS, V5, P83

[4] PICARD, 1944, J APP PHYS, V15, P678

[5] THE UNIVERSAL ELECTRON MICROSCOPE AS A HIGH RESOLUTION DIFFRACTION CAMERA [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (11) : 484 - 489

[6] PREBUS AF, 1944, COLLOID CHEM, V5, P181

[7] SIMARD, 1945, J APP PHYS, V16, P832

[8] THOMSON, 1930, P ROY SOC A, V128, P641

[9] VONARDENNE, 1940, ELECTRONEN UBERMIKRO, P71

[10] Wierl R, 1931, ANN PHYS-BERLIN, V8, P521

[1] THE USE OF THE ELECTRON DIFFRACTION CAMERA TO DETECT INSULATING FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1945, 16 (02) : 94 - 96

[2] ON THE IMPROVEMENT OF RESOLUTION IN ELECTRON DIFFRACTION CAMERAS [J]. JOURNAL OF APPLIED PHYSICS, 1946, 17 (01) : 12 - 22

[3] Kikuchi S., 1928, JPN J PHYS, V5, P83

[4] PICARD, 1944, J APP PHYS, V15, P678

[5] THE UNIVERSAL ELECTRON MICROSCOPE AS A HIGH RESOLUTION DIFFRACTION CAMERA [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (11) : 484 - 489

[6] PREBUS AF, 1944, COLLOID CHEM, V5, P181

[7] SIMARD, 1945, J APP PHYS, V16, P832

[8] THOMSON, 1930, P ROY SOC A, V128, P641

[9] VONARDENNE, 1940, ELECTRONEN UBERMIKRO, P71

[10] Wierl R, 1931, ANN PHYS-BERLIN, V8, P521