NEW TECHNIQUES IN OPTICAL INTERFEROMETRY

[1] ABELES F, 1948, ANN PHYS-PARIS, V3, P504

[2] AN INTERFERENCE MICROSCOPE FOR THE STUDY OF INHOMOGENEOUS MEDIA [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (04): : 134 - 135

[3] ARNULF A, 1950, J PHYS RADIUM, V11, pS35

[4] PRACTICAL METHODS OF MAKING AND USING MULTILAYER FILTERS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1947, 37 (10) : 792 - 797

[5] On the analysis of the bright spectrum lines [J]. ASTROPHYSICAL JOURNAL, 1904, 19 (03) : 190 - 211

[6] Concerning the reflection power of metals in thin layers for the infrared [J]. PHYSICAL REVIEW, 1931, 38 (02): : 338 - 345

[7] MEASURING A LARGE DISPLACEMENT BY INTERFEROMETRY [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1950, 1 (APR): : 87 - 91

[8] BARRELL H, 1948, Research, V1, P533

[9] NEW DEVELOPMENTS IN INTERFEROMETRY [J]. NATURE, 1949, 164 (4171) : 599 - 601

[10] Barrell H., 1939, PHIL T ROY SOC LOND, V238, P1

[1] ABELES F, 1948, ANN PHYS-PARIS, V3, P504

[2] AN INTERFERENCE MICROSCOPE FOR THE STUDY OF INHOMOGENEOUS MEDIA [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (04): : 134 - 135

[3] ARNULF A, 1950, J PHYS RADIUM, V11, pS35

[4] PRACTICAL METHODS OF MAKING AND USING MULTILAYER FILTERS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1947, 37 (10) : 792 - 797

[5] On the analysis of the bright spectrum lines [J]. ASTROPHYSICAL JOURNAL, 1904, 19 (03) : 190 - 211

[6] Concerning the reflection power of metals in thin layers for the infrared [J]. PHYSICAL REVIEW, 1931, 38 (02): : 338 - 345

[7] MEASURING A LARGE DISPLACEMENT BY INTERFEROMETRY [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1950, 1 (APR): : 87 - 91

[8] BARRELL H, 1948, Research, V1, P533

[9] NEW DEVELOPMENTS IN INTERFEROMETRY [J]. NATURE, 1949, 164 (4171) : 599 - 601

[10] Barrell H., 1939, PHIL T ROY SOC LOND, V238, P1