EVALUATION OF HGI2 DETECTORS FOR LEAD DETECTION IN PAINT

被引:7
作者
WANG, YJ
IWANCZYK, JS
GRAHAM, WR
机构
[1] Xsirius, Inc., Marina del Rey, CA 90292, 4640 Admiralty Way
基金
美国国家航空航天局;
关键词
D O I
10.1109/23.256672
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have conducted a laboratory study of HgI2 spectrometers used for in-situ determination of lead on painted surfaces. Cd-109 and Co-57 isotopes have been used to excite lead characteristic x-rays from samples. The energy resolution of HgI2 detectors in the energy region corresponding to lead K x-rays has been measured. An energy resolution of 880 eV (FWHM) for the 60 keV line from an Am-241 source has been obtained. Measurements using thin film standards ranging from 0.5 mg Pb/cm2 to 2 mg Pb/cm2 have been conducted. Detection limits, accuracy and precision of the measurements have been estimated. Based upon a comparison of the results that we have obtained with the performance of existing detector technology, the HgI2 detectors seem to be the best solution for handheld XRF lead analyzers.
引用
收藏
页码:846 / 850
页数:5
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