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A DIFFRACTION MEASUREMENT OF THE STRUCTURE OF CU2O FILMS GROWN ON COPPER

被引：23
作者：
BORIE, B
机构：
来源：
ACTA CRYSTALLOGRAPHICA | 1960年 / 13卷 / 07期
关键词：
D O I：
10.1107/S0365110X60001345
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：542 / 545
页数：4
相关论文
共 6 条
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CATHCART JV, 1959, COMMUNICATION
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ACTA METALLURGICA, 1956, 4 (02) :153-163
[3]  
Rose AJ, 1956, B MINERAL, V79, P619
[4]   A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J].
STOKES, AR .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 61 (346) :382-391
[5]   THE EFFECT OF COLD-WORK DISTORTION ON X-RAY PATTERNS [J].
WARREN, BE ;
AVERBACH, BL .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (06) :595-599
[6]   THE RATES OF OXIDATION OF SEVERAL FACES OF A SINGLE CRYSTAL OF COPPER AS DETERMINED WITH ELLIPTICALLY POLARIZED LIGHT [J].
YOUNG, FW ;
CATHCART, JV ;
GWATHMEY, AT .
ACTA METALLURGICA, 1956, 4 (02) :145-152
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