SILVER-HALIDE INFRARED FIBEROPTIC EVANESCENT WAVE SPECTROSCOPY FOR INSITU MONITORING OF THE CHEMICAL PROCESSES IN ADHESIVE CURING

被引：19

作者：

MARGALIT, E

DODIUK, H

KOSOWER, EM

KATZIR, A

机构：

[1] RAFAEL,DEPT MAT & PROC,POB 2250,HAIFA,ISRAEL

[2] TEL AVIV UNIV,SACKLER FAC EXACT SCI,SCH PHYS & ASTRON,IL-69978 TEL AVIV,ISRAEL

[3] TEL AVIV UNIV,SACKLER FAC EXACT SCI,SCH CHEM,IL-69978 TEL AVIV,ISRAEL

来源：

SURFACE AND INTERFACE ANALYSIS | 1990年 / 15卷 / 08期

关键词：

D O I：

10.1002/sia.740150806

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A silver halide infrared fibre‐optic evanescent wave spectroscopic technique for in situ monitoring of chemical processes and surface analysis is described. Attenuated total internal reflection (ATR) measurements with a Fourier transform infrared (FTIR) spectrometer allow spectra to be acquired at successive stages of chemical processes occurring within the surface layer. Samples are spread onto a fibre contained in a Teflon‐lined cell, and may be maintained under appropriate conditions of temperature and atmosphere. Monitoring of adhesive curing and coupling agent polymerization is accomplished easily and changes in spectroscopic features may be recognized in films as thin as a monolayer. The advantages and limitations of this surface analysis technique are discussed. Copyright © 1990 John Wiley & Sons Ltd.

引用

页码：473 / 478

页数：6

共 16 条

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