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Precision x-ray wavelength measurements

被引：5
作者：
Parratt, LG [1 ]
机构：
[1] Cornell Univ, Ithaca, NY USA
来源：
PHYSICAL REVIEW | 1935年 / 47卷 / 11期
关键词：
D O I：
10.1103/PhysRev.47.882
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：0882 / 0883
页数：2
相关论文
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