ELASTIC AND INELASTIC ELECTRON MEAN FREE PATHS FROM X-RAY PHOTOELECTRON DIFFRACTION EXPERIMENTS

被引：11

作者：

BONZEL, HP

BREUER, U

KNAUFF, O

机构：

[1] Institut für Grenzflächenforschung und Vakuumphysik, Kernforschungsanlage Jülich, Postfach 1913

来源：

SURFACE SCIENCE | 1990年 / 237卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(90)90509-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Angle-resolved detection of Pb4f 7 2 photoelectrons from a Pb(110) crystal was used in conjunction with deposited K overlayers to determine the elastic and inelastic mean free paths of electrons at 1345 eV energy in K. The angle-resolved 4f 7 2 intensity distribution along the [11̄0] azimuth showed large forward scattering enhancements whose attenuation by K overlayers was evaluated to yield an effective electron mean free path of 7.0 ± 1 A ̊. The inelastic and elastic mean free paths in K were determined as 45 ± 5 and 8 ± 4 A ̊, respectively. The high cross section for elastic scattering makes angle-resolved XPS (or Auger spectroscopy) a much more sensitive tool for detecting small coverages of adsorbates than its angle-integrated counterpart. © 1990.

引用

页码：L398 / L404

页数：7

共 32 条

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