FIELD-EMISSION FROM MICROTIP TEST ARRAYS USING RESISTOR STABILIZATION

被引：23

作者：

LEVINE, JD

MEYER, R

BAPTIST, R

FELTER, TE

TALIN, AA

机构：

[1] CEN GRENOBLE,LET CEA TECHNOL AVANCEES,F-38054 GRENOBLE,FRANCE

[2] SANDIA NATL LABS,LIVERMORE,CA 94551

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 02期

关键词：

701.1 Electricity: Basic Concepts and Phenomena - 714.1 Electron Tubes - 714.2 Semiconductor Devices and Integrated Circuits - 741.1 Light/Optics - 801 Chemistry - 804 Chemical Products Generally;

D O I：

10.1116/1.588336

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A lateral resistive layer which stabilizes field emission arrays also makes these devices robust. Initial activation of a microtip array after exposure to air and without bakeout can be accomplished with the sudden application of high voltage at room temperature, without fear of tip destruction. Analysis of initial activation curves of current versus time are made at various constant voltages in 11 tests. Reversible degradation and recovery of cathode emission is observed when contaminating anodes containing ITO and phosphor are replaced by a stainless steel anode. The major effect in the activation procedure is field induced desorption of a high work function adsorbate from the cathode. Analysis of the various I-V curves taken during the activation process at 55 V yields an equivalent series limiting resistance and the fraction of emitting microtips, which is 4% for a contaminating unbaked ITO anode and 10% for a stainless steel anode.

引用

页码：474 / 477

页数：4