AGING OF SUPERCONDUCTING Y1BA2CU3O7-X STRUCTURES ON SILICON

被引：17

作者：

COPETTI, CA

SCHUBERT, J

ZANDER, W

SOLTNER, H

POPPE, U

BUCHAL, C

机构：

[1] Institut für Schicht-und Ionentechnik, Forschungszentrum (KFA)

来源：

JOURNAL OF APPLIED PHYSICS | 1993年 / 73卷 / 03期

关键词：

D O I：

10.1063/1.353252

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The long-term stability of epitaxial thin film structures of superconducting Y1Ba2Cu3O7-, on silicon wafers (100), using a yttria-stabilized ZrO2(YSZ) buffer, is presented and compared to identical structures on SrTiO3 (100) and yttria-stabilized ZrO2 (100) single crystals. For Y1Ba2Cu3O7-y/YSZ/Si heterostructures, the maximum Y1Ba2Cu3O7-y film thickness is limited to 50 nm; otherwise thermal strain induces microcracks. Thinner films are more stable, but nevertheless show aging over several weeks, which affects critical current density and room-temperature resistivity, but not the critical temperature T(c).

引用

收藏

页码：1339 / 1342

页数：4

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