ATOMIC-FORCE MICROSCOPY IMAGES OF NATURAL ZEOLITE SURFACES OBSERVED UNDER AMBIENT CONDITIONS

被引：23

作者：

KOMIYAMA, M ^{[1
]}

YASHIMA, T ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,DEPT CHEM,TOKYO 152,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 6B期

关键词：

ATOMIC FORCE MICROSCOPY; ZEOLITE; HEULANDITE; STILBITE;

D O I：

10.1143/JJAP.33.3761

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Atomic force microscopy (AFM) images of the (010) faces of two natural zeolites, stilbite and heulandite, were obtained under ambient conditions. They show corrugations close to atomic resolution. For stilbite, crystallographic defects on its surface were observed for the first time. Heulandite images did not match with the surface structure expected from its bulk crystallographic data.

引用

页码：3761 / 3763

页数：3

共 6 条

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