CHARACTERIZATION OF OXIDE SUPERCONDUCTOR BY MEANS OF X-RAY-DIFFRACTOMETRY AND X-RAY ABSORPTION NEAR EDGE STRUCTURE

被引:4
作者
KIMURA, M
MATSUO, M
MURAKAMI, M
SAWANO, K
MATSUDA, S
机构
关键词
D O I
10.2355/isijinternational.29.213
中图分类号
TF [冶金工业];
学科分类号
0806 ;
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页码:213 / 222
页数:10
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