STRUCTURAL CHARACTERIZATION OF AMORPHOUS VANADIUM PENTOXIDE THIN-FILMS PREPARED BY CHEMICAL VAPOR-DEPOSITION [CVD]

被引:42
作者
SZORENYI, T
BALI, K
HEVESI, I
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D O I
10.1016/0022-3093(80)90368-3
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:1245 / 1248
页数:4
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