XPS STUDIES OF INTERFACES BETWEEN GAMMA-GLYCIDOXYPROPYLTRIMETHOXYSILANE AND ALUMINUM SURFACES

被引：38

作者：

LEUNG, YL ^{[1
]}

ZHOU, MY ^{[1
]}

WONG, PC ^{[1
]}

MITCHELL, KAR ^{[1
]}

FOSTER, T ^{[1
]}

机构：

[1] DEF RES ESTAB PACIFIC,CHEM GRP,VICTORIA V0S 1B0,BC,CANADA

来源：

APPLIED SURFACE SCIENCE | 1992年 / 59卷 / 01期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/0169-4332(92)90164-S

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Angular-dependent X-ray photoelectron spectroscopy (ADXPS) has been used to characterize interfaces formed by gamma-glycidoxypropyltrimethoxysilane (gamma-GPS) deposited on to aluminum panel surfaces. The application of a negative biasing potential to the sample with a thin gamma-GPS layer on chemically etched aluminum reveals an extra peak in the Al 2p spectra which is tentatively assigned to the effect of direct Si-O-Al bonding between silane and aluminum oxide. The dual approach of combining the ADXPS and bias potential techniques should have more general application to the non-destructive study of polymer/metal interfaces.

引用

页码：23 / 29

页数：7

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