EXTENSION OF THE ANALYTICAL RANGE OF TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY TO LIGHTER ELEMENTS (11 LESS-THAN-OR-EQUAL-TO Z LESS-THAN 16) AND INCREASE IN SENSITIVITY BY EXCITATION WITH TUNGSTEN L-ALPHA RADIATION

被引：15

作者：

FREITAG, K

REUS, U

FLEISCHHAUER, J

机构：

[1] Rich Seifert & Co, Ahrensburg, Germany

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1989年 / 44卷 / 05期

关键词：

Fluorescence - Sensitivity - Tungsten and Alloys - Applications - X-Ray Analysis;

D O I：

10.1016/0584-8547(89)80056-4

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The use of tungsten Lα radiation for excitation in the total reflection fluorescence (TXRF) spectrometer EXTRA II is described. Results of sensitivity determinations are reported. The analytical range of the instrument now extends down to sodium (Z = 11). Detection limits for a large number of elements have been improved significantly. The essential point is that this excitation mode does not require any changes to the instrument's hardware adjustment.

引用

页码：499 / 504

页数：6