LINE BROADENING IN PHOTOELECTRON SPECTROSCOPY

被引:67
作者
SAMSON, JAR
机构
关键词
D O I
10.1063/1.1684192
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The factors causing line broadening in photoelectron spectroscopy are discussed. Experimental results are given for the half-width of the 584 Å helium line emitted from a variety of sources. Typical half-width values lie between 1 and 6.5 mV, which corresponds to 0.027 and 0.18 Å, respectively. Curves are presented showing the contribution of the thermal motion of the photoionized gas to the spread in the energy of the ejected photoelectrons. © 1969 The American Institute of Physics.
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页码:1174 / &
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