ILLUMINANCE CRITICAL-POINTS ON GENERIC SMOOTH SURFACES

被引:14
作者
KOENDERINK, JJ
VANDOORN, AJ
机构
[1] Buys Ballot Laboratory, Utrecht University, Princetonplein
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1993年 / 10卷 / 05期
关键词
D O I
10.1364/JOSAA.10.000844
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We consider the qualitative structure of the illuminance distribution that is due to the illumination of a generic smooth surface under the following simPlifYing conditions: The surface bidirectional reflection distribution function is a constant (that is, it is Lambertian and with constant albedo), the surface is homogeneously illuminated, and vignetting and interreflection effects are absent. In that case the critical points of the illuminance distribution are determined by the local third-order differential structure of the surface, that is, by the gradients of its principal curvatures. We find the classes of local surface structure that may yield various types of critical points under variation of the direction of incidence. The parabolic points of the surface play a distinguished role. Two distinct generic types of parabolic points exist that behave qualitatively differently with respect to illumination. Finally, we consider various relaxations of the rather restrictive initial constraints.
引用
收藏
页码:844 / 854
页数:11
相关论文
共 19 条
[1]  
[Anonymous], 1760, PHOTOMETRIA SIVE MEN
[2]  
BANCHOFF T, 1982, CUSPS GAUSES MAPPING
[3]  
BLASCHKE W, 1967, DIFFERENTIAL GEOMETR
[4]   FAMILIES OF FLAT DIFFERENTIABLE CURVES [J].
DUFOUR, JP .
TOPOLOGY, 1983, 22 (04) :449-474
[5]  
FISCHER G, 1986, MATH MODELLE
[6]  
HILBERT D, 1944, ANSCHAULICHE GEOMETR
[7]  
HORN B., 1989, SHAPE SHADING
[8]  
KERGOSIEN YL, 1980, CR HEBD ACAD SCI, V299, P705
[9]   PHOTOMETRIC INVARIANTS RELATED TO SOLID SHAPE [J].
KOENDERINK, JJ ;
VANDOORN, AJ .
OPTICA ACTA, 1980, 27 (07) :981-996
[10]   GEOMETRICAL MODES AS A GENERAL-METHOD TO TREAT DIFFUSE INTERREFLECTIONS IN RADIOMETRY [J].
KOENDERINK, JJ ;
VANDOORN, AJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (06) :843-850