STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY - REPLY

被引：12

作者：

BATSTONE, JL ^{[1
]}

PHILLIPS, JM ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

关键词：

D O I：

10.1103/PhysRevLett.61.2275

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：2275 / 2275

页数：1

共 8 条

[1] EVIDENCE FOR THE INFLUENCE OF INTERFACIAL ATOMIC-STRUCTURE ON ELECTRICAL-PROPERTIES AT THE EPITAXIAL CAF2/SI(111) INTERFACE
BATSTONE, JL
PHILLIPS, JM
HUNKE, EC
[J]. PHYSICAL REVIEW LETTERS, 1988, 60 (14) : 1394 - 1397
[2] BATSTONE JL, 1988, MATER RES SOC S P, V102, P45
[3] ATOMIC-STRUCTURE OF THE NISI2/(111)SI INTERFACE
CHERNS, D
ANSTIS, GR
HUTCHISON, JL
SPENCE, JCH
[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (05): : 849 - 862
[4] THE ATOMIC-STRUCTURE OF THE NISI2-(001)SI INTERFACE
CHERNS, D
HETHERINGTON, CJD
HUMPHREYS, CJ
[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1984, 49 (01): : 165 - 177
[5] GIBSON JM, 1982, APPL PHYS LETT, V41, P818, DOI 10.1063/1.93699
[6] PHOTOEMISSION-STUDY OF BONDING AT THE CAF2-ON-SI(111) INTERFACE
OLMSTEAD, MA
UHRBERG, RIG
BRINGANS, RD
BACHRACH, RZ
[J]. PHYSICAL REVIEW B, 1987, 35 (14): : 7526 - 7532
[7] STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
TROMP, RM
LEGOUES, FK
KRAKOW, W
SCHOWALTER, LJ
[J]. PHYSICAL REVIEW LETTERS, 1988, 61 (19) : 2274 - 2274
[8] STRUCTURE OF THE SI(111)-CAF2 INTERFACE
TROMP, RM
REUTER, MC
[J]. PHYSICAL REVIEW LETTERS, 1988, 61 (15) : 1756 - 1759