OPTICAL-PROPERTIES OF AMORPHOUS-SEMICONDUCTOR MULTILAYER FILMS WITH RANDOM-THICKNESS WELL LAYERS

被引:13
作者
NITTA, S [1 ]
ITOH, T [1 ]
NONOMURA, S [1 ]
OHTA, H [1 ]
MORIGAKI, K [1 ]
机构
[1] UNIV TOKYO,INST SOLID STATE PHYS,MINATO KU,TOKYO 106,JAPAN
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1989年 / 60卷 / 01期
关键词
D O I
10.1080/13642818908228820
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:119 / 125
页数:7
相关论文
共 4 条
[1]   A NORMAL INCIDENCE SCANNING REFLECTOMETER OF HIGH PRECISION [J].
GERHARDT, U ;
RUBLOFF, GW .
APPLIED OPTICS, 1969, 8 (02) :305-&
[2]   OPTICAL-PROPERTIES OF A-SI-H AND A-SIXC1-X-H FILMS PREPARED BY GLOW-DISCHARGE DEPOSITION [J].
NITTA, S ;
ITOH, S ;
TANAKA, M ;
ENDO, T ;
HATANO, A .
SOLAR ENERGY MATERIALS, 1982, 8 (1-3) :249-257
[3]  
UGUR H, 1985, TEDRAHEDRALLY BONDED, P425
[4]   GAP STATES AND RECOMBINATION PROCESSES IN ONE-DIMENSIONALLY ORDERED AND DISORDERED A-SI-H/A-SI1-XNX-H MULTILAYER FILMS [J].
YAMAGUCHI, M ;
OHTA, H ;
OGIHARA, C ;
YOKOMICHI, H ;
MORIGAKI, K ;
NONOMURA, S ;
NITTA, S .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 97-8 :931-934