THE TEMPERATURE-DEPENDENCE OF THE REFRACTIVE INDEX OF SILICON

被引：22

作者：

LUKES, F

机构：

来源：

关键词：

D O I：

10.1016/0022-3697(59)90241-0

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：342 / 344

页数：3

共 9 条

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[4] LUKES F, 1958, CZECH J PHYS, V8, P253
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[7] INTER-RELATION BETWEEN OPTICAL CONSTANTS FOR LEAD TELLURIDE AND SILICON
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[8] THE INDEX OF REFRACTION OF GERMANIUM MEASURED BY AN INTERFERENCE METHOD
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[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (01) : 13 - 16
[9] INFRARED REFRACTIVE INDEXES OF SILICON GERMANIUM AND MODIFIED SELENIUM GLASS
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[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (03) : 244 - 246