SURFACE-STRUCTURE OF CL/NI(111) DETERMINED BY SURFACE EXAFS SPECTROSCOPY AND SOFT-X-RAY STANDING-WAVE METHOD

被引：19

作者：

FUNABASHI, M

YOKOYAMA, T

TAKATA, Y

OHTA, T

KITAJIMA, Y

KURODA, H

机构：

[1] HIROSHIMA UNIV,FAC SCI,DEPT MAT SCI,NAKA KU,HIROSHIMA 730,JAPAN

[2] RES DEV CORP JAPAN,TSUKUBA,IBARAKI 30026,JAPAN

[3] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,OHO,IBARAKI 305,JAPAN

[4] UNIV TOKYO,FAC SCI,DEPT CHEM,TOKYO 113,JAPAN

来源：

SURFACE SCIENCE | 1991年 / 242卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(91)90242-K

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The surface structure of (square-root 3 x square-root 3)R 30-degreesCl/Ni(111) has been examined by the combination of polarization-dependent surface EXAFS spectroscopy and the soft X-ray standing wave (SW) method. The surface EXAFS analysis revealed that chlorine atoms locate at the three-fold hollow site with the Cl-Ni bond distance of (2.33 +/- 0.02) angstrom, corresponding to the spacing between Cl and surface Ni layers of (1.83 +/- 0.02) angstrom. The SW measurement allowed the determination of the displacement of Cl; it is located 1.82 angstrom above the Ni(111) lattice plane. Consequently, surface relaxation is not accompanied by the adsorption of 1/3 of a monolayer (ML) of Cl atoms. The magnitudes of surface relaxation induced by S and Cl adsorption on (100), (110) and (111) surfaces are compared and discussed.

引用

页码：59 / 64

页数：6

共 20 条

[1] ADSORBATE-GEOMETRY DETERMINATION BY MEASUREMENT AND ANALYSIS OF ANGLE-RESOLVED-PHOTOEMISSION EXTENDED-FINE-STRUCTURE DATA - APPLICATION TO C(2X2)S/NI(001) [J].