INSITU CHARACTERIZATION OF THE ILLUMINATED SILICON-ELECTROLYTE INTERFACE BY FOURIER-TRANSFORM INFRARED-SPECTROSCOPY

被引：75

作者：

PETER, LM ^{[1
]}

BLACKWOOD, DJ ^{[1
]}

PONS, S ^{[1
]}

机构：

[1] UNIV UTAH,DEPT CHEM,SALT LAKE CITY,UT 84112

来源：

PHYSICAL REVIEW LETTERS | 1989年 / 62卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.62.308

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：308 / 311

页数：4

共 16 条

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