STRATEGIES FOR DETERMINATION OF INTER-ATOMIC DISTANCES FROM EXTENDED ENERGY-LOSS FINE-STRUCTURE

被引:3
作者
TAFRESHI, MA
CSILLAG, S
ZOU, WY
BOHM, C
机构
来源
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1991年 / 2卷 / 05期
关键词
D O I
10.1051/mmm:0199100205051500
中图分类号
TH742 [显微镜];
学科分类号
摘要
In Extended Energy Loss Fine Structure spectroscopy (EXELFS), modulations occuring on the high energy slope of the ionization edges in electron energy loss spectra are investigated. These modulations supply important structural and chemical information about the local atomic environment of the absorbing atoms. The accuracy and the reproducibility of the results, however, are greatly influenced by the procedures used in the data analysis In this paper a detailed study of the analyzing method for determination of the interatomic distances is presented. A reliable FFT based deconvolution procedure for extending the method to thick samples is also described.
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页码:515 / 530
页数:16
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