THE INJECTION OF INERT-GAS IONS INTO SOLIDS - THEIR TRAPPING AND ESCAPE

被引：42

作者：

CARTER, G

ARMOUR, DG

DONNELLY, SE

INGRAM, DC

WEBB, RP

机构：

来源：

RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1980年 / 53卷 / 3-4期

关键词：

D O I：

10.1080/00337578008207113

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：143 / 173

页数：31

共 104 条

[1] COLLECTION AND SPUTTERING EXPERIMENTS WITH NOBLE GAS IONS
ALMEN, O
BRUCE, G
[J]. NUCLEAR INSTRUMENTS & METHODS, 1961, 11 (02): : 257 - 278
[2] SPUTTERING EXPERIMENTS IN THE HIGH ENERGY REGION
ALMEN, O
BRUCE, G
[J]. NUCLEAR INSTRUMENTS & METHODS, 1961, 11 (02): : 279 - 289
[3] DEFECT DISTRIBUTIONS IN CHANNELING EXPERIMENTS
ANDERSEN, HH
SIGMUND, P
[J]. NUCLEAR INSTRUMENTS & METHODS, 1965, 38 (DEC): : 238 - &
[4] BAUER W, 1971, P INT C RAD INDUCED
[5] TRAPPING OF LOW-ENERGY HELIUM IONS IN NIOBIUM
BEHRISCH, R
BOTTIGER, J
ECKSTEIN, W
ROTH, J
SCHERZER, BMU
[J]. JOURNAL OF NUCLEAR MATERIALS, 1975, 56 (03) : 365 - 367
[6] BESENBACHER F, 1979, 8TH INT C AT COLL SO
[7] Biersack J. P., 1973, Radiation Effects, V19, P249, DOI 10.1080/00337577308232256
[8] INFLUENCE OF SPUTTERING, RANGE SHORTENING AND STRESS-INDUCED OUT-DIFFUSION ON RETENTION OF XENON IMPLANTED IN SILICON
BLANK, P
WITTMAACK, K
SCHULZ, F
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 387 - 392
[9] Bottiger J., 1971, Radiation Effects, V11, P61, DOI 10.1080/00337577108230450
[10] Bottiger J., 1971, Radiation Effects, V11, P69, DOI 10.1080/00337577108230451