TRANSMISSION OPTICS OF FOCUSED ION BEAMS USED IN MASS SPECTROMETRY

被引：8

作者：

DIETZ, LA

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1960年 / 31卷 / 11期

关键词：

D O I：

10.1063/1.1716859

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1229 / 1233

页数：5

共 26 条

[1] ON THE SPHERICAL ABERRATION CONSTANT [J].

ARCHARD, GD .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1958, 29 (11) :1049-1050

[2] DYNAMICS OF ELECTRON BEAMS FROM MAGNETICALLY SHIELDED GUNS [J].

ASHKIN, A .

JOURNAL OF APPLIED PHYSICS, 1958, 29 (11) :1594-1604

[3] ELECTRON BEAM ANALYZER [J].

ASHKIN, A .

JOURNAL OF APPLIED PHYSICS, 1957, 28 (05) :564-569

[4]

BARNARD GP, 1953, MODERN MASS SPECTROM, P69

[5] SOME CHARACTERISTICS OF A MAGNETICALLY FOCUSED ELECTRON BEAM [J].

BREWER, GR .

JOURNAL OF APPLIED PHYSICS, 1959, 30 (07) :1022-1038

[6] The paths of ions and electrons in non-uniform magnetic fields [J].

Coggeshall, ND ;

Muskat, M .

PHYSICAL REVIEW, 1944, 66 (7/8) :187-198

[7] FRINGING FLUX CORRECTIONS FOR MAGNETIC FOCUSING DEVICES [J].

COGGESHALL, ND .

JOURNAL OF APPLIED PHYSICS, 1947, 18 (10) :855-861

[8]

Cutler C. C., 1955, P IRE, V43, P307

[9] PIN-HOLE CAMERA INVESTIGATION OF ELECTRON BEAMS [J].

CUTLER, CC ;

SALOOM, JA .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1955, 43 (03) :299-306

[10] A DETAILED ANALYSIS OF BEAM FORMATION WITH ELECTRON GUNS OF THE PIERCE TYPE [J].

DANIELSON, WE ;

ROSENFELD, JL ;

SALOOM, JA .

BELL SYSTEM TECHNICAL JOURNAL, 1956, 35 (02) :375-420

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