X-RAY TOPOGRAPHY OF TWINNED CRYSTALS

被引：31

作者：

KLAPPER, H

机构：

来源：

PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1987年 / 14卷

关键词：

D O I：

10.1016/0146-3535(87)90023-2

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

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页码：367 / 401

页数：35

相关论文

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[82] X-RAY TOPOGRAPHIC STUDY OF QUARTZ CRYSTALS TWINNED ACCORDING TO JAPAN TWIN LAW [J].

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