INFRA-RED INTERNAL REFLEXION STUDIES OF GERMANIUM/ELECTROLYTE INTERFACE

[1] BECKMANN KH, 1967, INT REFLECTION SPECT, P250

[2] BECKMANN KH, 1967, PRIVATE COMMUNICATIO

[3] PHYSICAL THEORY OF SEMICONDUCTOR SURFACES [J]. PHYSICAL REVIEW, 1955, 99 (02): : 376 - 387

[4] EXPANDED FORMULAS FOR ATTENUATED TOTAL REFLECTION AND DERIVATION OF ABSORPTION RULES FOR SINGLE AND MULTIPLE ATR SPECTROMETER CELLS [J]. SPECTROCHIMICA ACTA, 1965, 21 (04): : 815 - &

[5] INTERNAL REFLECTION SPECTROSCOPIC OBSERVATION OF ELECTRODE-SOLUTION INTERFACE [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1966, 88 (05) : 1062 - &

[6] OBSERVATION OF ELECTRODE-SOLUTION INTERFACE BY MEANS OF INTERNAL REFLECTION SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1966, 38 (13) : 1810 - +

[7] ELECTRIC FIELD STRENGTHS AT TOTALLY REFLECTING INTERFACES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (07) : 851 - &

[8] OPTICAL SPECTRUM OF SEMICONDUCTOR SURFACE STATES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW, 1962, 125 (04): : 1165 - &

[9] HARRICK NJ, 1967, INT REFLECTION SPECT

[10] AN IN SITU SPECTROPHOTOMETRIC METHOD FOR OBSERVING INFRARED SPECTRA OF SPECIES AT ELECTRODE SURFACE DURING ELECTROLYSIS [J]. ANALYTICAL CHEMISTRY, 1966, 38 (01) : 119 - &

[1] BECKMANN KH, 1967, INT REFLECTION SPECT, P250

[2] BECKMANN KH, 1967, PRIVATE COMMUNICATIO

[3] PHYSICAL THEORY OF SEMICONDUCTOR SURFACES [J]. PHYSICAL REVIEW, 1955, 99 (02): : 376 - 387

[4] EXPANDED FORMULAS FOR ATTENUATED TOTAL REFLECTION AND DERIVATION OF ABSORPTION RULES FOR SINGLE AND MULTIPLE ATR SPECTROMETER CELLS [J]. SPECTROCHIMICA ACTA, 1965, 21 (04): : 815 - &

[5] INTERNAL REFLECTION SPECTROSCOPIC OBSERVATION OF ELECTRODE-SOLUTION INTERFACE [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1966, 88 (05) : 1062 - &

[6] OBSERVATION OF ELECTRODE-SOLUTION INTERFACE BY MEANS OF INTERNAL REFLECTION SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1966, 38 (13) : 1810 - +

[7] ELECTRIC FIELD STRENGTHS AT TOTALLY REFLECTING INTERFACES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (07) : 851 - &

[8] OPTICAL SPECTRUM OF SEMICONDUCTOR SURFACE STATES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW, 1962, 125 (04): : 1165 - &

[9] HARRICK NJ, 1967, INT REFLECTION SPECT

[10] AN IN SITU SPECTROPHOTOMETRIC METHOD FOR OBSERVING INFRARED SPECTRA OF SPECIES AT ELECTRODE SURFACE DURING ELECTROLYSIS [J]. ANALYTICAL CHEMISTRY, 1966, 38 (01) : 119 - &