EFFECTS OF OVERHEATING IN A SINGLE-ELECTRON TRANSISTOR

被引:26
作者
KOROTKOV, AN
SAMUELSEN, MR
VASENKO, SA
机构
[1] MOSCOW MV LOMONOSOV STATE UNIV, INST NUCL PHYS, MOSCOW 119899, RUSSIA
[2] TECH UNIV DENMARK, DEPT PHYS, DK-2800 LYNGBY, DENMARK
[3] MOSCOW MV LOMONOSOV STATE UNIV, DEPT PHYS, MOSCOW 119899, RUSSIA
关键词
D O I
10.1063/1.357424
中图分类号
O59 [应用物理学];
学科分类号
摘要
Heating of a single-electron transistor (SET) caused by the current flowing through it is considered. The current and the temperature increase should be calculated self-consistently taking into account various paths of the heat drain. Even if there is no heat drain from the central electrode of the SET due to transfer of phonons, the temperature of this electrode remains finite because electron tunneling decreases the temperature difference between the central and outer electrodes. Overheating effects can cause hysteresis in the I-V curve of the SET in the vicinity of the Coulomb blockade threshold.
引用
收藏
页码:3623 / 3631
页数:9
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