CARBON FOIL THICKNESS DEPENDENT ELECTRON YIELDS INDUCED BY SWIFT HIGHLY-CHARGED IONS

被引：3

作者：

BILLEBAUD, A

CARABY, C

CASSIMI, A

CHEVALLIER, M

GERVAIS, B

GRANDIN, JP

GROENEVELD, KO

JARDIN, P

JUNG, M

MAIER, R

ROTHARD, H

机构：

[1] CTR INTERDISCIPLINAIRE RECH IONS LOURDS, MIXTE LAB, CEA, CNRS, F-14040 CAEN, FRANCE

[2] UNIV LYON 1, INST PHYS NUCL LYON, IN2P3, CNRS, F-69622 VILLEURBANNE, FRANCE

[3] UNIV FRANKFURT, INST KERNPHYS, D-60486 FRANKFURT, GERMANY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 98卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(95)00174-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We measured electron yields from the beam entrance and exit surfaces of thin carbon foils (d approximate to 4-700 mu g/cm(2)) bombarded with swift (E(p)/M = 13.6 MeV/u) highly charged (q = 16-18) Ar ions. The dependence of the electron yields on target thickness d is analyzed within the framework of a phenomenological semiempirical model. We obtained electron transport lengths of high energy (E much greater than 100 eV) delta-electrons and diffusion lengths of slow electrons (E much less than 100 eV), The projectile velocity dependence of these transport lengths is investigated by comparing our present results for 13.6 MeV/u Ar with results obtained with 0.1 MeV/u Ne, 1 MeV/u C, 3.9 MeV/u S and 74 MeV/u Ni. We also discuss the relation between electron yields and the electronic stopping power.

引用

页码：492 / 496

页数：5

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