A RESONANT CAVITY STUDY OF SEMICONDUCTORS

被引:5
作者
HSIEH, HT
GOLDEY, JM
BROWN, SC
机构
关键词
D O I
10.1063/1.1721630
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:302 / 307
页数:6
相关论文
共 6 条
[1]  
BETHE HA, 1943, D1117 NAT DEF RES CO
[2]   MEASUREMENT OF THE DIELECTRIC CONSTANT AND LOSS OF SOLIDS AND LIQUIDS BY A CAVITY PERTURBATION METHOD [J].
BIRNBAUM, G ;
FRANEAU, J .
JOURNAL OF APPLIED PHYSICS, 1949, 20 (08) :817-818
[3]  
CONWELL FM, 1952, P IRE, V40, P1327
[4]  
FEENBERG E, 1942, GC16907 SPERR GYR CO
[5]  
HSIEH HT, 1952, 2 MIT SOL STAT MOL T
[6]  
MONTGOMERY CG, 1947, TECHNIQUES MICROWAVE, V11, P293