EXPERIMENTAL-STUDY OF ANDERSON LOCALIZATION IN THIN WIRES

被引:119
作者
GIORDANO, N [1 ]
GILSON, W [1 ]
PROBER, DE [1 ]
机构
[1] YALE UNIV,DEPT ENGN & APPL SCI,NEW HAVEN,CT 06520
关键词
D O I
10.1103/PhysRevLett.43.725
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The electrical properties of wires with cross-sectional areas (A) in the range 1×10-11 to 3×10-10 cm2 have been studied. At temperatures below about 10 K the resistance of the wires increases with decreasing temperature. The size of the increase varies as A-1 and becomes larger as the impurity resistance is made larger, in qualitative agreement with recent theoretical predictions by Thouless. The size of the increase is in order-of-magnitude agreement with the theory but the temperature dependence is not. © 1979 The American Physical Society.
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收藏
页码:725 / 728
页数:4
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