ON THE DETERMINATION OF TRAP DEPTH FROM THERMALLY STIMULATED CURRENTS

被引：23

作者：

MAETA, S

SAKAGUCHI, K

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1980年 / 19卷 / 03期

关键词：

D O I：

10.1143/JJAP.19.519

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：519 / 526

页数：8

共 21 条

[1]

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[6] A NOTE ON THE ANALYSIS OF 1ST-ORDER GLOW CURVES [J].

GROSSWEINER, LI .

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[7] THEORY AND APPLICATION OF THERMALLY STIMULATED CURRENTS IN PHOTOCONDUCTORS [J].

HAERING, RR ;

ADAMS, EN .

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[8] EVALUATION OF THERMAL ACTIVATION ENERGIES FROM GLOW CURVES [J].

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BRANER, AA .

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[9]

Hoogenstraaten W., 1958, PHILIPS RES REP, V13, P515

[10] THERMALLY STIMULATED EMISSION AND CONDUCTIVITY PEAKS IN CASE OF TEMPERATURE DEPENDENT TRAPPING CROSS SECTIONS [J].

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