HIGH-RESOLUTION SUPERCONDUCTING X-RAY SPECTROMETERS WITH ALUMINUM TRAPPING LAYERS OF DIFFERENT THICKNESSES

被引：3

作者：

MEARS, CA ^{[1
]}

LABOV, SE ^{[1
]}

HILLER, LH ^{[1
]}

FRANK, M ^{[1
]}

NETEL, H ^{[1
]}

AZGUI, F ^{[1
]}

BARFKNECHT, AT ^{[1
]}

机构：

[1] CONDUCTUS INC,SUNNYVALE,CA 94086

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1109/77.403240

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.

引用

页码：3069 / 3072

页数：4

共 12 条

[1]

Barfknetcht A. T., 1991, IEEE T MAG, VMAG-27, P970

[2] MODELING OF CHARACTERISTICS FOR JOSEPHSON-JUNCTIONS HAVING NONUNIFORM WIDTH OR JOSEPHSON CURRENT-DENSITY [J].