ELECTRICAL CONDUCTION IN SINGLE-CRYSTAL ALUMINUM THIN FILMS

被引:17
作者
JAYADEVAIAH, TS
KIRBY, RE
机构
[1] Department of Electrical Engineering, Institute for Surface Studies, University of Wisconsin - Milwaukee, Milwaukee
[2] Department of Physics, Institute for Surface Studies, University of Wisconsin - Milwaukee, Milwaukee
关键词
D O I
10.1063/1.1652945
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electrical conduction in thin (400-1500 Å) single-crystal aluminum films vacuum evaporated on NaCl substrates is explained by a simple model and verified by experimental results. The resistivity of the inter-island boundaries is accounted for by considering the film structure as a metal - insulator matrix and calculating its equivalent resistivity. An unambiguous comparison can then be made with the Fuchs - Sondheimer theory of size-affected conduction in thin metal films only after subtracting off the resistivity contribution due to interisland boundaries. © 1969 The American Institute of Physics.
引用
收藏
页码:150 / +
页数:1
相关论文
共 11 条
[1]  
ADAMSKY RF, 1966, USE THIN FILMS PHYSI
[3]  
CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P299
[4]   ELECTRICAL SIZE EFFECT IN ALUMINUM [J].
FORSVOLL, K ;
HOLWECH, I .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (08) :2230-&
[5]   The conductivity of thin metallic films according to the electron theory of metals [J].
Fuchs, K .
PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108
[6]   INTRINSIC RESISTIVITY AND ELECTRON MEAN FREE PATH IN ALUMINUM FILMS [J].
MAYADAS, AF .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) :4241-&
[7]   ELECTRICAL CONDUCTION OF THIN METALLIC FILMS WITH ROUGH SURFACE [J].
NAMBA, Y .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) :6117-&
[8]   ELECTRICAL CONDUCTION MECHANISM IN ULTRATHIN, EVAPORATED METAL FILMS [J].
NEUGEBAUER, CA ;
WEBB, MB .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (01) :74-&
[9]   THE MEAN FREE PATH OF ELECTRONS IN METALS [J].
SONDHEIMER, EH .
ADVANCES IN PHYSICS, 1952, 1 (01) :1-42
[10]  
SWANSON JG, 1968, THIN SOLID FILMS, V1, P325