INTERNAL FRICTION OF SINGLE CRYSTAL SILICON FROM 25-DEGREES-C TO 1100-DEGREES-C

被引:11
作者
SOUTHGATE, PD
机构
来源
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B | 1957年 / 70卷 / 08期
关键词
D O I
10.1088/0370-1301/70/8/111
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
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页码:804 / 806
页数:3
相关论文
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[2]   INFRARED ABSORPTION AND OXYGEN CONTENT IN SILICON AND GERMANIUM [J].
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