PHOTOELECTRON MICROSCOPE FOR X-RAY MICROSCOPY AND MICROANALYSIS

被引：23

作者：

POLACK, F

LOWENTHAL, S

机构：

[1] UNIV PARIS SUD,INST OPT,F-91406 ORSAY,FRANCE

[2] UNIV PARIS 11,LAB UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE

来源：

关键词：

D O I：

10.1063/1.1136565

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：207 / 212

页数：6

共 17 条

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HANSEN, RA
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (09) : 3923 - 3928
[6] GRIVET P, 1965, ELECTRON OPTICS
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[8] 0.1-10-KEV X-RAY-INDUCED ELECTRON EMISSIONS FROM SOLIDS - MODELS AND SECONDARY-ELECTRON MEASUREMENTS
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ATTWOOD, DT
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[10] X-RAY MICROSCOPY WITH SYNCHROTRON RADIATION
NIEMANN, B
RUDOLPH, D
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