LASER-ABSORPTION MEASUREMENT OF OH ION DISTRIBUTION PROFILES IN SILICA GLASSES

被引：4

作者：

RADLOFF, W

BELOW, E

WAGNER, H

KLEINERT, P

机构：

[1] ACAD SCI GDR,CENT INST SOLID STATE PHYS & MAT SCI,DRESDEN,GER DEM REP

[2] ACAD SCI GDR,CENT INST SOLID STATE PHYS & MAT SCI,DDR-69 JENA,GER DEM REP

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1982年 / 69卷 / 01期

关键词：

D O I：

10.1002/pssa.2210690150

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K21 / K24

页数：4

共 6 条

[1]

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[2]

Bershtein V. A., 1971, Fizika Tverdogo Tela, V13, P693

[3]

BLACK PW, 1974, P ELECTROOPTICAL DES

HORIGUCHI, M ;

KAWACHI, M .

APPLIED OPTICS, 1978, 17 (16) :2570-2574

[5] BROADLY TUNABLE CW LASER USING COLOR-CENTERS [J].

MOLLENAUER, LF ;

OLSON, DH .

[6] PROGRESS IN OPTICAL-WAVEGUIDE PROCESS AND MATERIALS [J].

SCHULTZ, PC .

APPLIED OPTICS, 1979, 18 (21) :3684-3693