COMMENTS ON OBSERVED STREAKING IN FIELD-ION MICROSCOPY IMAGES OF TUNGSTEN-10 AT PERCENT RHENIUM

被引：1

作者：

CLUM, JA

MOAZED, KL

机构：

来源：

JOURNAL OF THE LESS-COMMON METALS | 1970年 / 21卷 / 02期

关键词：

D O I：

10.1016/0022-5088(70)90119-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：203 / &

共 9 条

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[3]

MULLER EW, 1960, 4 INT C EL MICR BERL, V1, P820

[4] STREAK CONTRAST IN FIELD-ION MICROGRAPHS [J].

RALPH, B ;

BOWKETT, KM .

PHILOSOPHICAL MAGAZINE, 1966, 13 (126) :1283-&

[5] A FIELD ION MICROSCOPE STUDY OF SOME TUNGSTENRHENIUM ALLOYS [J].

RALPH, B ;

BRANDON, DG .

PHILOSOPHICAL MAGAZINE, 1963, 8 (90) :919-&

[6] INTERPRETATION OF FIELD-ION MICROGRAPHS - STREAK CONTRAST [J].

RANGANATHAN, S ;

BOWKETT, KM ;

HREN, J ;

RALPH, B .

PHILOSOPHICAL MAGAZINE, 1965, 12 (118) :841-+

[7]

SCHWARTZ DM, 1968, THESIS CAMBRIDGE U

[8] A FIELD-ION MICROSCOPY STUDY OF A TUNGSTEN-3 AT PERCENT RHENIUM ALLOY - STREAK CONTRAST EFFECTS [J].

SOFFA, WA ;

MOAZED, KL .

JOURNAL OF THE LESS-COMMON METALS, 1968, 14 (02) :211-&

[9]

SOFFA WA, 1967, 14 FIELD EM S

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