AN IMPROVED LUMPED CAPACITANCE METHOD FOR DIELECTRIC MEASUREMENT

被引：3

作者：

LIAN, A

ZHONG, W

机构：

[1] Department of Physics, Shandong University

来源：

JOURNAL OF MATERIALS SCIENCE | 1990年 / 25卷 / 10期

关键词：

D O I：

10.1007/BF00581094

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An improved lumped capacitance method for dielectric measurement in the broad microwave frequency range is proposed, with which many disadvantages occurring in the previous lumped capacitance method can be avoided. It is an easier and more convenient method for the dielectric measurement of ferroelectrics. Experiments have confirmed the feasibility of the method in the low microwave frequency range. © 1990 Chapman and Hall Ltd.

引用

收藏

页码：4349 / 4355

页数：7

相关论文

共 11 条

[1] MEASUREMENT OF RADIO-FREQUENCY PERMITTIVITY OF BIOLOGICAL TISSUES WITH AN OPEN-ENDED COAXIAL LINE .1. [J].

ATHEY, TW ;

STUCHLY, MA ;

STUCHLY, SS .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1982, 30 (01) :82-86

[2]

BELLAMY WL, 1985, T ASAE, V28, P313

[3] NUMERICAL SOLUTION OF SOME IMPORTANT TRANSMISSION-LINE PROBLEMS [J].

GREEN, HE .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1965, MT13 (05) :676-&

[4] FRINGING FIELD-EFFECT IN LUMPED-CAPACITANCE METHOD FOR PERMITTIVITY MEASUREMENT [J].

ISKANDER, MF ;

STUCHLY, SS .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1978, 27 (01) :107-109

[5]

KOLODZIEJ H, 1975, DIELECTRIC RELATED M, V2, P249

[6] LUMPED CAPACITANCE METHOD FOR MEASUREMENT OF PERMITTIVITY AND CONDUCTIVITY IN FREQUENCY AND TIME DOMAIN - FURTHER ANALYSIS [J].

RZEPECKA, MA ;

STUCHLY, SS .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1975, IM24 (01) :27-32

[7] COAXIAL LINE REFLECTION METHODS FOR MEASURING DIELECTRIC-PROPERTIES OF BIOLOGICAL SUBSTANCES AT RADIO AND MICROWAVE-FREQUENCIES - A REVIEW [J].

STUCHLY, MA ;

STUCHLY, SS .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1980, 29 (03) :176-183

[8] UNCERTAINTIES IN RADIOFREQUENCY DIELECTRIC MEASUREMENTS OF BIOLOGICAL SUBSTANCES [J].

STUCHLY, SS ;

KRASZEWSKI, A ;

STUCHLY, MA .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (01) :67-70

[9] PERMITTIVITY MEASUREMENTS AT MICROWAVE-FREQUENCIES USING LUMPED ELEMENTS [J].

STUCHLY, SS ;

RZEPECKA, MA ;

ISKANDER, MF .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1974, 23 (01) :56-62

[10]

VONHIPPEL AR, 1954, DIELECTRIC MATERIALS