REFLECTOMETRY BY MEANS OF OPTICAL-COHERENCE MODULATION

被引：37

作者：

HOTATE, K

KAMATANI, O

机构：

来源：

ELECTRONICS LETTERS | 1989年 / 25卷 / 22期

关键词：

D O I：

10.1049/el:19891009

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1503 / 1505

页数：3

共 7 条

[1]

BARFUSS H, 1989, IEEE J LIGHTWAVE TEC, V7, P3

[2] OPTICAL REFLECTOMETRY WITH MICROMETER RESOLUTION FOR THE INVESTIGATION OF INTEGRATED OPTICAL-DEVICES [J].

BEAUD, P ;

SCHUTZ, J ;

HODEL, W ;

WEBER, HP ;

GILGEN, HH ;

SALATHE, RP .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1989, 25 (04) :755-759

[3] OFDR DIAGNOSTICS FOR FIBER AND INTEGRATED-OPTIC SYSTEMS [J].

KINGSLEY, SA ;

DAVIES, DEN .

ELECTRONICS LETTERS, 1985, 21 (10) :434-435

[4] OVER 720 GHZ (5.8NM) FREQUENCY TUNING BY A 1.5-MU-M DBR LASER WITH PHASE AND BRAGG WAVELENGTH CONTROL REGIONS [J].

MURATA, S ;

MITO, I ;

KOBAYASHI, K .

ELECTRONICS LETTERS, 1987, 23 (08) :403-405

[5]

NAZARATHY M, 1989, OFC 89, P150

[6] CHARACTERIZATION OF SILICA-BASED WAVE-GUIDES WITH AN INTERFEROMETRIC OPTICAL TIME-DOMAIN REFLECTOMETRY SYSTEM USING A 1.3-MU-M-WAVELENGTH SUPERLUMINESCENT DIODE [J].

TAKADA, K ;

TAKATO, N ;

NODA, J ;

NOGUCHI, Y .

OPTICS LETTERS, 1989, 14 (13) :706-708

[7] OPTICAL COHERENCE-DOMAIN REFLECTOMETRY - A NEW OPTICAL EVALUATION TECHNIQUE [J].

YOUNGQUIST, RC ;

CARR, S ;

DAVIES, DEN .

OPTICS LETTERS, 1987, 12 (03) :158-160

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