FULL POLARIZATION MEASUREMENT OF SYNCHROTRON RADIATION WITH USE OF SOFT-X-RAY MULTILAYERS

被引：35

作者：

KIMURA, H ^{[1
]}

YAMAMOTO, M ^{[1
]}

YANAGIHARA, M ^{[1
]}

MAEHARA, T ^{[1
]}

NAMIOKA, T ^{[1
]}

机构：

[1] TOHOKU UNIV,SCI MEASUREMENTS RES INST,SENDAI,MIYAGI 980,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期

关键词：

D O I：

10.1063/1.1143075

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Using two Ru/Si multilayers as a phase shifter and an analyzer, we have measured the state of polarization for 12.8-nm synchrotron radiation (SR) of the beam line 11A at the Photon Factory. It has been found that the state of polarization depends largely on the vertical inclination angle of the first mirror of the beam line. From the phase information, we have determined parameters of the polarization ellipse including handedness.

引用

页码：1379 / 1382

页数：4

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