STRUCTURE AND OPTICAL-PROPERTIES OF EVAPORATED-FILMS OF VANADIUM

In the present work, the interpretation of the structure, nucleation and growth of vanadium films will be studied. Film structure was inferred from transmission electron diffraction and microscopy of vanadium films evaporated simultaneously onto freshly cleaved rocksalt and carbon substrate. The investigated films were from about 10 to 80 nm thick, and the rate of the deposition was fixed at 3 nm sec** minus **1 throughout this work. The optical constants were determined for vanadium from transmission measurements on vacuum-evaporated polycrystalline thin films at room temperature in the infrared range. Transmission measurements were made on films in the thickness range 100 to 150 nm.