THERMAL DIFFUSE X-RAY-SCATTERING STUDIES OF THE WATER-VAPOR INTERFACE

被引:192
作者
SCHWARTZ, DK
SCHLOSSMAN, ML
KAWAMOTO, EH
KELLOGG, GJ
PERSHAN, PS
OCKO, BM
机构
[1] HARVARD UNIV, DEPT APPL SCI, CAMBRIDGE, MA 02138 USA
[2] BROOKHAVEN NATL LAB, DEPT PHYS, UPTON, NY 11973 USA
来源
PHYSICAL REVIEW A | 1990年 / 41卷 / 10期
关键词
D O I
10.1103/PhysRevA.41.5687
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Agreement between the theoretical and measured resolution dependence of x-ray specular reflection from the H2O-vapor interface shows that the macroscopic capillary model for surface roughness can be extended to length scales as small as 400. Agreement between measured thermal diffuse scattering data and the theoretical form, with no significant adjustable parameters, independently leads to similar conclusions. © 1990 The American Physical Society.
引用
收藏
页码:5687 / 5690
页数:4
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