ABOUT THE TREATMENT OF WEAK REFLECTIONS IN DIRECT PROCEDURES

被引：8

作者：

CASCARANO, G

GIACOVAZZO, C

GUAGLIARDI, A

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1991年 / 47卷

关键词：

D O I：

10.1107/S0108767391004816

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Measurement of weak reflexions is often skipped by computer-controlled diffractometers. Such a practice can cause systematic errors in the scale and thermal factors as calculated by a Wilson plot, with consequent difficulties for the solution of the crystal structure by direct methods. A simple statistical method for estimating unobserved reflexions is described together with applications of the method.

引用

页码：698 / 702

页数：5

共 16 条

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