QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS OF THIN-FILMS USING LAMA-2

[1] CALCULATION METHODS FOR FLUORESCENT X-RAY SPECTROMETRY - EMPIRICAL COEFFICIENTS VS FUNDAMENTAL PARAMETERS [J]. ANALYTICAL CHEMISTRY, 1968, 40 (07) : 1080 - &

[2] CRISS JW, 1966, ELECTRON MICROPROBE, P217

[3] GOULD RW, 1972, XRAY SPECTROMETRY, V1, P29

[4] ERRORS IN THEORETICAL CORRECTION SYSTEMS IN QUANTITATIVE ELECTRON-PROBE MICROANALYSIS - SYNOPSIS [J]. ANALYTICAL CHEMISTRY, 1972, 44 (02) : 350 - &

[5] SIMULTANEOUS DETERMINATION OF COMPOSITION AND MASS THICKNESS OF THIN-FILMS BY QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1977, 49 (08) : 1152 - 1156

[6] LAGUITTON D, 1977, ADV XRAY ANAL, V20, P515

[7] Shiraiwa T., 1969, ADV XRAY ANAL, V12, P446

[8] THEORETICAL ANALYSIS OF QUANTITATIVE X-RAY EMISSION DATA - GLASSES, ROCKS, AND METALS [J]. ANALYTICAL CHEMISTRY, 1971, 43 (13) : 1761 - +

[1] CALCULATION METHODS FOR FLUORESCENT X-RAY SPECTROMETRY - EMPIRICAL COEFFICIENTS VS FUNDAMENTAL PARAMETERS [J]. ANALYTICAL CHEMISTRY, 1968, 40 (07) : 1080 - &

[2] CRISS JW, 1966, ELECTRON MICROPROBE, P217

[3] GOULD RW, 1972, XRAY SPECTROMETRY, V1, P29

[4] ERRORS IN THEORETICAL CORRECTION SYSTEMS IN QUANTITATIVE ELECTRON-PROBE MICROANALYSIS - SYNOPSIS [J]. ANALYTICAL CHEMISTRY, 1972, 44 (02) : 350 - &

[5] SIMULTANEOUS DETERMINATION OF COMPOSITION AND MASS THICKNESS OF THIN-FILMS BY QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1977, 49 (08) : 1152 - 1156

[6] LAGUITTON D, 1977, ADV XRAY ANAL, V20, P515

[7] Shiraiwa T., 1969, ADV XRAY ANAL, V12, P446

[8] THEORETICAL ANALYSIS OF QUANTITATIVE X-RAY EMISSION DATA - GLASSES, ROCKS, AND METALS [J]. ANALYTICAL CHEMISTRY, 1971, 43 (13) : 1761 - +