AUTOMATIC INSTRUMENT FOR ELECTRON SCATTERING MEASUREMENTS

[1] WIDE-RANGE LOGARITHMIC RADIATION METER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (06) : 301 - 304

[2] BLACKSTOCK, 1955, REV SCI INSTR, V26, P274

[3] THE ORIGIN OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (APR): : 101 - 106

[4] MARTON, 1955, PHYS REV, V99, P495

[5] MOLLENSTEDT G, 1949, OPTIK, V5, P499

[6] MOLLENSTEDT G, 1952, OPTIK, V9, P473

[7] MODIFICATION OF ELECTRON MICROSCOPE FOR ELECTRON OPTICAL SHADOW METHOD [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (07) : 669 - 670

[8] SNYDER, 1950, REV SCI INSTR, V21, P852

[9] STEIGERWALD KH, 1949, OPTIK, V5, P469

[1] WIDE-RANGE LOGARITHMIC RADIATION METER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (06) : 301 - 304

[2] BLACKSTOCK, 1955, REV SCI INSTR, V26, P274

[3] THE ORIGIN OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPE [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (APR): : 101 - 106

[4] MARTON, 1955, PHYS REV, V99, P495

[5] MOLLENSTEDT G, 1949, OPTIK, V5, P499

[6] MOLLENSTEDT G, 1952, OPTIK, V9, P473

[7] MODIFICATION OF ELECTRON MICROSCOPE FOR ELECTRON OPTICAL SHADOW METHOD [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (07) : 669 - 670

[8] SNYDER, 1950, REV SCI INSTR, V21, P852

[9] STEIGERWALD KH, 1949, OPTIK, V5, P469